Strain-Induced Elastic Buckling Instability for Mechanical Measurements (SIEBIMM)

Measuring mechanical properties of a thin film is a big challenge due to its low strength that prohibits use of conventional mechanical testers. At the same time, nanoindentation is difficult as it is model dependent and knowledge of indenter tip shape is needed. In this indigenously developed SIEBIMM technique, polymer thin films are coated on a mechanically robust elastomeric flexible substrate with. Tensile and compression stress applied on the composite sample leads to a unique buckling pattern of the top layer film which is used to calculate its mechanical bending (Young"s modulus) properties.