Finding an Article using IEEE Xplore
IEEE Xplore contains articles on various electrical engineering topics, as well as aerospace, biomedical, computer, and geosciences. If you are off-campus, use the proxy server by accessing IEEE Xplore using the UA Libraries Catalog or Web site.
Selecting the What Can I Access? link shows that we subscribe to
- IEEE Journals and Conferences
- IET Journals and Conferences
- IEEE active and historical standards including redline versions that show changes but NOT draft standards Go to Finding an IEEE Standard
- Standards Dictionary
- VDE Verlag Conference Proceedings (select titles).
- Bell Labs Technical Journal
If you find an article that you cannot access in IEEE Xplore, we might have a copy available elsewhere whether it is an electronic copy in another database or in a book at our library.
In the reference section of a paper that you are reading, you found another interesting article. If this article is in a IEEE or IET (IEE) journals or conference proceedings, it would be quickest to access IEEE Xplore directly since much of this content is available full text. You can either Browse to find the volume, issue, and page containing the article (go to IEEE's Tutorial on browsing the content) or you can use the search box. Generally when searching, the title is fastest.
In an ideal world, references would always be right. Unfortunately, this is not always the case. If the article is not located where you thought, you can use IEEE Xplore to verify/find the reference information. Try variations of the information that you have. If you have the correct author and title, you should be able to locate the article. Otherwise, you might have to experiment using different searches to find it.
If it is not an IEEE or IET publication, you can try a different database (i.e. Compendex via Engineering Village [tutorial]).
There are several options for searches. There is a Global search box on the Home Web page. On the Advanced Search Web page, there is an Advanced Search, a Command Search, and a Citation Search. Some general search tips are:
- the search looks for ALL words with stemming (s, es, ed, ing) when there are not quotes,
- singular perturbation (1500 results);
- quotes indicate a EXACT phrase,
- “singular perturbation” (1007 results);
- For more variations use * as a wildcard,
- singular* perturb* (2181 results); and
- Most special characters are ignored. Some exceptions are & + /
Advanced Search can be used for most searching. Please use IEEE's Tutorials on advanced search techniques.
As an example, try a Structured Advanced Search using "Very Large Scale Integration" (VLSI) AND robotic(s).
|"very large scale integration"||in||Metadata Only|
|1. A new compact analog VLSI model for Spike Timing Dependent Plasticity
Azghadi, M.R.; Al-Sarawi, S.; Iannella, N.; Abbott, D.
Very Large Scale Integration (VLSI-SoC)
Digital Object Identifier 10.1109/VLSI-SoC.2013.6673236
Publication Year: 2013
IEEE Conference Publications
Abstract (html) PDF ©
|2. A Systematic Method for Configuring VLSI Networks of Spiking
Neftci, E; Chicca, E; Indiveri, G; Douglas, R
Neural Computation, Volume 23, Issue 10, Pages: 2457 - 2497
Digital Object Identifier: 10.1162/NECO_a_00182
Publication Year: 2011
MIT Press Journals
We are able to download Article 1 because it is part of our subscription. You can always verify coverage using the What Can I Access? link. Article 2 is not part our subscription. It is from the MIT Press Journals, so we do not have electronic access to this in IEEE Xplore (we will find out that we have access to this later – elsewhere).
Notice that there is an icon that indicates that we have access with Article 1. Records for items that are not part of our subscription (i.e. Article 2) might contain less indexing information, such as subject or index terms. In the beginning, you will mainly be interested in accessing the article. Index terms (under the keyword tab in the detailed record) can eliminate some irrelevant results if used alone. Their use can provide a more thorough search when used in conjunction with a keyword search (not to be confused with the keyword tab). Keep in mind that not all documents have index terms, so you will exclude those items when performing an index term search alone.
A new compact analog VLSI model for Spike Timing Dependent Plasticity
INSPEC: CONTROLLED INDEXING
VLSI, analogue circuits, integrated circuit design, integrated circuit modelling, plasticity
INSPEC: NON-CONTROLLED INDEXING
STDP, protocols, STDP-like learning mechanisms, VLSI circuit design, compact analog VLSI model, neuromorphic engineering, pattern recognition, robotics, spike patterns, spike timing dependent plasticity, symmetric design, time-based Hebbian learning experiments, time-based synaptic plasticity rule, very large scale integration circuit design
Note: There are many categories of terms that could appear for a document. This example only contained two of them. There could have been IEEE, MESH, and DOE terms. There could have been author keywords as well.
If you are using an article as a reference, you might want to export the citation into RefWorks [tutorial]. Select desired items then select the Download Citations button. Be sure to select the RefWorks format.
As stated earlier, we do not have access to Article 2 using IEEE Xplore, but we do have an electronic copy available elsewhere. Select the LinkSource button. Full Text is available at EBSCO.
There is not “only one” answer for these questions. Please try the following (to see a possible way to solve it, hover over hint) .
- Let’s say you want to find as many articles as you can on the topic to be sure that your dissertation topic is not already taken. Note: You KNOW in reality, you would need to search several databases including Dissertation Abstracts; however, you are just going to look in IEEE Xplore for this exercise.
- You want to present a paper on “model order reduction” for your class project. You want to know what techniques are being used before you decide which technique or type of application you would like to present.
Please take a VERY short survey and check your answer to the bonus question.