Materials Characterization

Materials Characterization [PDF]

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Capability Matrix Examples [PDF]

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X-Ray Photoelectron Spectrometer (XPS)

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Scanning Auger Nanoprobe (SAN)

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Micro Computed Tomography (Micro CT) Scanner

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X-Ray Diffractometer (XRD)

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Raman Spectrometer

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Small Angle X-Ray Scattering (SAXS)

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Atomic Force Microscope (AFM)

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Nanoindenter / Nanoscratch System

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Confocal Laser Scanning Microscope

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Multiphoton Laser Scanning Microscope

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Imaging Ellipsometer

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Circular Dichroism (CD) Spectrometer

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Thin Film Deposition System

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