Materials Characterization

Materials Characterization

Materials Characterization labs offer analytical instrumentation for liquid, powder, surface and bulk materials analysis and characterization. These resources are available to UA faculty members and students, outside researchers and industry.


  • Corrosion analysis
  • Elemental analysis
  • 3D imaging
  • In-air and in-liquid imaging
  • Thermal processing and analysis
  • Chemical composition
  • Crystal structure
  • Organic, inorganic, soft/hard materials, and coatings


  • Auger Electron Spectroscopy (AES)
  • X-Ray Photoelectron Spectroscopy (XPS)


  • Infinite Focus Microscope (IFM)
  • Confocal Laser Scanning Microscopy (CLSM)
  • Scanning Electron Microscopy/Energy Dispersive X-Ray (SEM/EDX)
  • Atomic Force Microscopy (AFM)
  • Kelvin Probe Force Microscopy (KPFM)
  • Stereomicroscopy
  • Fluorescence Microscopy
  • Phase Contrast Microscopy
  • X-Ray Diffraction (XRD)
Focused Ion Bean technology on NCERCAMP's SEM

The word "Akron" has been etched onto a sample using Focused Ion Bean technology on NCERCAMP's SEM. At only 10 μm, this etching is about 1/5 the thickness of a human hair.



264 Wolf Ledges Parkway
Akron, Ohio 44325


Office: 330-972-6978
Fax: 330-972-5141