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Surface and Optical Analysis Facility
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Surface and Optical Analysis Facility
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Instruments

  • X-Ray Photoelectron Spectrometer (XPS)
  • Scanning Auger Nanoprobe
  • Atomic Force Microscope (AFM)
  • X-Ray Diffractometer (XRD)
  • Micro Computed Tomography (Micro CT) Scanner
  • Two Raman Spectrometers
  • Nanoindenter/Nanoscratch
  • Multiphoton Laser Scanning Microscope
  • Confocal Laser Scanning Microscope
  • Small Angle X-Ray Scattering (SAXS)
  • Imaging Ellipsometer
  • Thin Film Physical Vapor Deposition System

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