Atomic Force Microscope (AFM)


  • Three-dimensional surface topographic imaging. Imaging surface roughness, electrical conductivity, capacitance, mechanical parameters (modulus, hardness) and magnetic properties are possible
  • Applications: imaging of thin films and coatings, nanostructures, batteries and energy storage, biocompatibility, corrosion and antifouling, data storage, optics, photovoltaics, semiconductor and microelectronic devices, sensors and actuators, tribology (hardness, lubrication, and wear). Imaging the structure of biological molecules, cellular components, cells or tissues