Materials Characterization
The National Polymer Innovation Center (NPIC) offers advanced materials characterization services to provide detailed insights into the composition, structure, and properties of polymers and other materials. Our cutting-edge instrumentation and expert staff deliver accurate, reliable data to support research, development, and quality control.
Our equipment and capabilities include:
- Atomic Force Microscope (AFM)
- Birefringence
- Confocal Laser Scanning Microscope
- Dynamic Light Scattering (DLS)
- Ellipsometer
- Fourier Transform Infrared Spectroscopy (FTIR)
- Micro Computed Tomography (Micro CT) Scanner
- Multiphoton Laser Scanning Microscope
- NanoIR Spectrometer
- Nuclear Magnetic Resonance (NMR)
- Raman Spectrometer
- Scanning Auger Nanoprobe (SAN)
- Scanning Electron Microscope (SEM)
- Small Angle X-Ray Scattering (SAXS)
- Static Light Scattering (SLS)
- Transmission Electron Microscope (TEM)
- X-Ray Diffractometer (XRD)
- X-Ray Photoelectron Spectrometer (XPS)
Whether you need surface chemical analysis, advanced microscopy and imaging, spectroscopy, or detailed phase and structural characterization, NPIC has the tools and expertise to support your materials innovation.