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Pilot Processing
Materials Characterization
X-Ray Photoelectron Spectrometer (XPS)
Scanning Auger Nanoprobe (SAN)
Micro Computed Tomography (Micro CT) Scanner
X-Ray Diffractometer (XRD)
Raman Spectrometer
Small Angle X-Ray Scattering (SAXS)
Atomic Force Microscope (AFM)
Nanoindenter / Nanoscratch System
Confocal Laser Scanning Microscope
Multiphoton Laser Scanning Microscope
Imaging Ellipsometer
Thin Film Deposition System
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Materials Characterization
Materials Characterization [PDF]
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Capability Matrix Examples [PDF]
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X-Ray Photoelectron Spectrometer (XPS)
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Atomic Force Microscope (AFM)
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Micro Computed Tomography (Micro CT) Scanner
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X-Ray Diffractometer (XRD)
Learn More
Raman Spectrometer
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Small Angle X-Ray Scattering (SAXS)
Learn More
Scanning Auger Nanoprobe (SAN)
Learn More
Nanoindenter / Nanoscratch System
Learn More
Confocal Laser Scanning Microscope
Learn More
Imaging Ellipsometer
Learn More
Thin Film Deposition System
Learn More
