Imaging Ellipsometer


  • Ellipsometry measures changes in the polarization state of light when the beam is reflected from a surface. Provides material dependent images based on changes in light polarization across a sample.
  • Applications: structure of organic coatings and changes due to corrosion, changes in coatings with exposure to humidity and environmental aging, graphene, polymers, solar cells, nanoparticles, hydrogels, self-assembled monolayers (SAMs)