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X-Ray Diffractometer (XRD)


  • X-Ray Diffraction (XRD) is a non-destructive analytical technique providing information about crystal structure, chemical composition and physical characteristics of materials and thin films
  • Applications: identification and quantification of the crystalline phase, thin film thickness measurements, corrosion, nanomaterials, powders, materials for tribological control, biomaterials, thin polymer films, thin film multilayers, patterned films